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    2. Dataray光束質量分析,光斑分析,M2光束分析系統

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      Dataray光束質量分析,光斑分析,M2光束分析系統

       

      Dataray光束質量分析,光斑分析,M2光束分析系統

      美國 DataRay 公司提供激光光束分析儀器,對激光光束的光斑大小,形狀和能量分布等參數進行全面的測試和分析;同時與個人電腦連接對分析的結果提供二維或三維的顯示,并對分析的結果進行打印輸出。適合各種各樣的激光光束,幫助你對你的激光光束的品質提供一個量化的結果。

      產品分為:
      相機式光束質量分析儀(CCD式) Beam Profiling Cameras
      狹縫掃描式光束質量分析儀 Slit Scan Beam Profilers

      查看Dataray光束質量分析儀的選擇向導Dataray光束質量分析儀

      相機式光束質量分析儀(CCD式)
      Beam Profiling Cameras

      WinCamD系列

      WinCamD-UCD12
      WinCamD-UCD12
      WinCamD-UCD15
      WinCamD-UCD15
      WinCamD-UCD23
      WinCamD-UCD23
      WinCamD-UHR
      WinCamD-UHR
      WinCamD-XHR
      WinCamD-XHR
      WinCamD-FIR-HR
      WinCamD-FIR-HR
      WinCamD-LCM
      WinCamD-LCM


      BladeCam-HR和BladeCam-XHR系列

      BladeCam-XHR
      BladeCam-XHR
      System-BladeCam-XHR
      BladeCam-XHR-1310
      BladeCam-XHR-1310
      System-BladeCam-XHR-1310
      BladeCam-XHR-UV
      BladeCam-XHR-UV
      System-BladeCam-XHR-UV
      BladeCam-XHR
      BladeCam-XHR
      System-BladeCam-XHR
      BladeCam-XHR-1310
      BladeCam-XHR-1310
      System-BladeCam-XHR-1310
      BladeCam-XHR-UV
      BladeCam-XHR-UV
      System-BladeCam-XHR-UV


      TaperCamD-UCD12和TaperCamD20-15-UCD23系列

      TaperCamD-UCD12
      TaperCamD-UCD12
      System-TaperCamD-UCD12
      TaperCamD-UCD12-1310
      TaperCamD-UCD12-1310
      System-TaperCamD-UCD12-1310
      TaperCamD-UCD12-NIR
      TaperCamD-UCD12-NIR
      System-TaperCamD-UCD12-NIR
      TaperCamD20-15-UCD23
      TaperCamD20-15-UCD23
      System-TaperCamD20-15-UCD23
      TaperCamD20-15-UCD23-1310
      TaperCamD20-15-UCD23-1310
      System-TaperCamD20-15-UCD23-1310
      TaperCamD20-15-UCD23-NIR
      TaperCamD20-15-UCD23-NIR
      System-TaperCamD20-15-UCD23-NIR


      相機式光束質量分析儀附件

      Filters/Samplers/Attenuators
      Filters/Samplers/Attenuators
      Lenses/Optics
      Lenses/Optics
      Translation Stages/Hardware
      Translation Stages/Hardware
      UV/IR Converters
      UV/IR Converters
      Replacement Detectors
      Replacement Detectors
      Replacement Cables
      Replacement Cables
      Manuals
      Manuals

      狹縫掃描式光束質量分析儀
      Slit Scan Beam Profilers

      Beam'R2系列

      Beam'R2-Si
      Beam'R2-S
      System-BR2-Si
      Beam'R2-InGaAs
      Beam'R2-InGaAs
      System-BR2-IGA
      Beam'R2-DD Si/InGaAs (190-1750 nm)
      Beam'R2-DD Si/InGaAs (190-1750 nm)
      System-BR2-DD
      Beam'R2-DD Si/InGaAs (190-2300 nm)
      Beam'R2-DD Si/InGaAs (190-2300 nm)
      System-BR2-DD-2300
      Beam'R2-DD Si/InGaAs (190-2500 nm)
      Beam'R2-DD Si/InGaAs (190-2500 nm)
      System-BR2-DD-2500


      BeamMap2 4XY/3XYKE系列

      BeamMap2-4XY-Si
      BeamMap2-4XY-Si
      System-BMS2-4XY-Si
      BeamMap2-4XY-InGaAs
      BeamMap2-4XY-InGaAs
      System-BMS2-4XY-IGA
      BeamMap2-4XY-DD Si/InGaAs
      BeamMap2-4XY-DD Si/InGaAs
      System-BMS2-4XY-DD
      BeamMap2-3XYKE-Si
      BeamMap2-3XYKE-Si
      System-BMS2-3XYKE-Si
      BeamMap2-3XYKE-InGaAs
      BeamMap2-3XYKE-InGaAs
      System-BMS2-3XYKE-IGA
      BeamMap2-3XYKE-DD Si/InGaAs
      BeamMap2-3XYKE-DD Si/InGaAs
      System-BMS2-3XYKE-DD


      BeamMap2 ColliMate系列

      BeamMap2-CM4-Si
      BeamMap2-CM4-Si
      System-BMS2-CM4-Si
      BeamMap2-CM4-InGaAs
      BeamMap2-CM4-InGaAs>
      System-BMS2-CM4-IGA
      BeamMap2-CM4-DD Si/InGaAs
      BeamMap2-CM4-DD Si/InGaAs
      System-BMS2-CM4-DD
      BeamMap2-CM3-Si
      BeamMap2-CM3-Si
      System-BMS2-CM3-Si
      BeamMap2-CM3-InGaAs
      BeamMap2-CM3-InGaAs
      System-BMS2-CM3-IGA
      BeamMap2-CM3-DD Si/InGaAs
      BeamMap2-CM3-DD Si/InGaAs
      System-BMS2-CM3-DD


      BeamScope-P8 系列

      BeamScope-P8-Si
      BeamScope-P8-Si
      System-BSC-P8-Si
      BeamScope-P8-Ge
      BeamScope-P8-Ge
      System-BSC-P8-Ge
      BeamScope-P8-InAs
      BeamScope-P8-InAs
      System-BSC-P8-IA
      BeamScope-P8-Si, extended probe head
      BeamScope-P8-Si, extended probe head
      System-BSC-P8-Si-EPH
      BeamScope-P8-Ge, extended probe head
      BeamScope-P8-Ge, extended probe head
      System-BSC-P8-Ge-EPH
      BeamScope-P8-InAs, extended probe head
      BeamScope-P8-InAs, extended probe head
      System-BSC-P8-IA-EPH


      狹縫掃描式光束質量分析儀附件

      Samplers/Attenuators
      Samplers/Attenuators
      Lenses/Optics
      Lenses/Optics>
      Translation Stages/Hardware
      Translation Stages/Hardware
      BeamScope Slits/Pinholes
      BeamScope Slits/Pinholes
      True2D Sapphire Slits
      True2D Sapphire Slits
      Replacement Cables
      Replacement Cables
      Manuals
      Manuals

       


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