<track id="arlyl"><span id="arlyl"></span></track>

<menuitem id="arlyl"></menuitem>
  • <tbody id="arlyl"></tbody>

  • 
    
    1. <menuitem id="arlyl"><dfn id="arlyl"></dfn></menuitem>
    2. nanocalc膜厚測量

      光纖光譜儀,積分球,均勻光源,太赫茲系統應用專家
      光譜儀
      >>
      光譜儀系統
      >>
      激光器
      >>
      激光測量
      >>
      寬帶光源
      >>
      LED和影像測量
      >>
      光譜儀附件
      >>
      太赫茲系統
      >>
      濾光片
       濾光片
      石墨烯納米材料
       石墨烯納米材料
       

       

      NanoCalc 反射膜厚測量系統

      膜厚測量 薄膜的光學特性主要有反射和干涉。NanoCalc薄膜反射測量系統可以用來進行10nm -250um的膜厚分析測量,對單層膜的分辨率為0.1nm。根據測量軟件的不同,在1秒鐘內可以分析單層或多達到10層的膜厚。

       

      產品特點

      • 可分析單層或多層薄膜;
      • 分辨率達0.1nm;
      • 適合于在線監測;

      使用原理

      常用的兩種測量薄膜的特性的方法為光學反射和投射測量、橢圓光度法測量。NanoCalc利用反射原理,通過測量寬光譜范圍內的反射率曲線來進行膜厚測量。

      查找n和k值

      可以進行多達十層的薄膜測量,薄膜和基體材質可以是金屬、電介質、無定形材料或硅晶等。NanoCalc軟件包含了大多數材料的n和k值數據庫,用戶也可以自己添加和編輯。

       

        膜厚測量

      應用

      NanoCalc薄膜反射材料系統適合于在線膜厚測量,包括氧化層、中氮化硅薄膜、感光膠片及其它類型的薄膜。NanoCalc也可測量在鋼、鋁、銅、陶瓷、塑料等物質上的抗反射涂層、抗磨涂層等。

      NanoCalc Systems Available

      NANOCALC-2000-UV-VIS-NIR

      Wavelength:

      250-1100 nm

      Thickness:

      10 nm-70 um

      Light source:

      Deuterium and Tungsten Halogen

      NANOCALC-2000-UV-VIS

      Wavelength:

      250-850 nm

      Thickness:

      10 nm-20 um

      Light source:

      Deuterium and Tungsten Halogen

      NANOCALC-2000-VIS-NIR

      Wavelength:

      400-1100 nm

      Thickness:

      20 nm-10 um (optional 1 um-250 um)

      Light source:

      Tungsten Halogen

      NANOCALC-2000-VIS

      Wavelength:

      400-850 nm

      Thickness:

      50 nm-20 um

      Light source:

      Tungsten Halogen

      NANOCALC-2000-NIR

      Wavelength:

      650-1100 nm

      Thickness:

      70 nm-70 um

      Light source:

      Tungsten Halogen

      NANOCALC-2000-NIR-HR

      Wavelength:

      650-1100 nm

      Thickness:

      70 nm-70 um

      Light source:

      Tungsten Halogen

      NANOCALC-2000-512-NIR

      Wavelength:

      900-1700 nm

      Thickness:

      50 nm-200 um

      Light source:

      High-power Tungsten Halogen

      For Reflectometry applications, the following items are required:

      NC-2UV-VIS100-2

      Bifurcated UV fiber
      400 um x 2m
      2x SMA connectors
      Flexible metal jacketing

      NC-STATE

      Single point reflection measurement for non transparent samples

      Step-Wafer 5 Steps 0-500 mm, calibrated 4"

      If using a microscope, the following items are also needed:

      NC-7UV-VIS200-2

      Reflection probe for application microscopy with MFA-C-Mount

      Step-Wafer 5 Steps 0-500 mm, calibrated 4"

      NanoCalc Specifications

      Angle of incidence:

      90°

      Number of layers:

      3 or fewer

      Reference measurement needed:

      Yes (bare substrate)

      Transparent materials:

      Yes

      Transmission mode:

      Yes

      Rough materials:

      Yes

      Measurement speed:

      100 milliseconds to 1 second

      On-line possibilities:

      Yes

      Mechanical tolerance (height):

      With new reference or collimation (74-UV)

      Mechanical tolerance (angle):

      Yes, with new reference

      Microspot option:

      Yes, with microscope

      Vision option:

      Yes, with microscope

      Mapping option:

      6" and 12" XYZ mapping tables

      Vacuum possibilities:

      Yes

       

       


      玻色智能科技有限公司光譜儀專家
      上海玻色智能科技有限公司
      上海: (021)3353-0926, 3353-0928   北京: (010)8217-0506
      廣州: 139-0221-4841   武漢: 139-1733-4172
      全國銷售服務熱線:4006-171751   Email: info@bosontech.com.cn
      m.epu.ac.cn    2008-2022 All Rights Reserved!
      国产欧美日韩综合视频在线观看,一本色道久久综合亚洲精品高清,亚洲 欧美 自拍 另类 日韩,蜜芽中文久久精品无码91
      <track id="arlyl"><span id="arlyl"></span></track>

      <menuitem id="arlyl"></menuitem>
    3. <tbody id="arlyl"></tbody>

    4. 
      
      1. <menuitem id="arlyl"><dfn id="arlyl"></dfn></menuitem>